ISSN 0236-235X (P)
ISSN 2311-2735 (E)

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1
Publication date:
16 March 2021
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Keyword: single event effects

  1. Integrated circuits elements optimization for single-event prevention
  2. Authors: Шунков В.Е.

  3. A fault injector to test the SoC-processor to single event upsets
  4. Authors: Чекмарёв С.А.