ISSN 0236-235X (P)
ISSN 2311-2735 (E)

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Higher Attestation Commission (VAK) - К1 quartile
Russian Science Citation Index (RSCI)

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2
Publication date:
16 June 2024

Keyword: stochastic testing

  1. The development of the system for microprocessor random testing INTEG
  2. Authors: Грибков И.В., Захаров А.В., Кольцов П.П., Котович Н.В., Кравченко А.А., Куцаев А.С., Осипов А.С., Хисамбеев И.Ш., Коганов М.А.